Publications

Conference Paper

• Background-Adaptive Surface Defect Detection Neural Networks via Positive Samples
  Tongzhi Niu, Biao Chen (Co-first author), Zhenrong Wang, Ruoqi Zhang, Bin Li*
  Accepted by the 49th Annual Conference of the IEEE Industrial Electronics Society (IECON 2023).

Journal Paper

• Feature Matching Driven Background Generalization Neural Networks for Surface Defect Segmentation
  Biao Chen, Tongzhi Niu*, Ruoqi Zhang, Hang Zhang, Yuchen Lin, Bin Li
  Accepted by the Knowledge Based Systems [J] (SCI, Q1, IF=8.8).

• A-Net: A Lightweight Real-time Segmentation Network for Surface Defect Detection
  Biao Chen, Tongzhi Niu, Wenyong Yu*, Ruoqi Zhang, Zhenrong Wang, Bin Li
  Accepted by the IEEE Transactions on Instrumentation & Measurement [J] (SCI, Q1, IF= 5.6).

• Scoring Bayesian Neural Networks for Learning from Inconsistent Labels in Surface Defect Segmentation
  Tongzhi Niu*, Biao Chen, Qianhang Lv; Bei Li; Wei Luo; Bin Li
  Accepted by the Measurement [J] (SCI, Q1, IF=5.6).

• Lightweight Convolutional Neural Networks for Surface Defect Segmentation Based on Neural Architecture Search
  Biao Chen, Tongzhi Niu*, Yuchen Lin, Hang Zhang, Baohui Liu, Miao Wang
  Under Review, Multimedia Tools and Applications [J] (SCI, Q2, IF=3.6).

Competition Paper

• Trading strategy: a multi-dimensional market trading decision model
  Biao Chen, Yunshu Zhou, Lanlin Zhu
  Mathematical Contest In Modeling (Consortium for Mathematics and Its Applications)